Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe

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dc.contributor.author Chen, Yimeng
dc.contributor.author Martin, Isabelle
dc.contributor.author Prosa, Ty
dc.contributor.author Ulfig, Robert
dc.contributor.author Rice, Katherine P.
dc.contributor.author Larson, David J.
dc.contributor.author Reinhard, David A.
dc.contributor.author Lenz, Dan
dc.contributor.author Brewer, Nicholas R.
dc.contributor.author Holman, Michael
dc.contributor.author Hanna, Jacob
dc.contributor.author Groth, Gard
dc.contributor.author Pal, Avnish Singh
dc.contributor.author Basu, Joysurya
dc.date.accessioned 2024-04-04T09:49:28Z
dc.date.available 2024-04-04T09:49:28Z
dc.date.issued 2023-07-22
dc.identifier.issn 14358115
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/3090
dc.description This paper published with affiliation IIT (BHU), Varanasi in open access mode. en_US
dc.language.iso en en_US
dc.publisher NLM (Medline) en_US
dc.relation.ispartofseries Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada;29
dc.title Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe en_US
dc.type Article en_US


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