Exponentiated Weibull distribution approach based inflection S-shaped software reliability growth model

Sagar, B.B.; Saket, R.K.; Singh, Col. Gurmit

dc.contributor.author	Sagar, B.B.
dc.contributor.author	Saket, R.K.
dc.contributor.author	Singh, Col. Gurmit
dc.date.accessioned	2020-02-20T07:32:47Z
dc.date.available	2020-02-20T07:32:47Z
dc.date.issued	2015-07-10
dc.identifier.issn	20904479
dc.identifier.uri	http://localhost:8080/xmlui/handle/123456789/643
dc.description.abstract	The aim of this paper was to estimate the number of defects in software and remove them successfully. This paper incorporates Weibull distribution approach along with inflection S-shaped Software Reliability Growth Models (SRGM). In this combination two parameter Weibull distribution methodology is used. Relative Prediction Error (RPE) is calculated to predict the validity criterion of the developed model. Experimental results on actual data from five data sets are compared with two other existing models, which expose that the proposed software reliability growth model predicts better estimation to remove the defects. This paper presents best software reliability growth model with including feature of both Weibull distribution and inflection S-shaped SRGM to estimate the defects of software system, and provide help to researchers and software industries to develop highly reliable software products.	en_US
dc.description.sponsorship	Banaras Hindu University BHU Birla Institute of Technology and Science, Pilani Indian Institute of Technology Bombay	en_US
dc.language.iso	en_US	en_US
dc.publisher	Ain Shams University	en_US
dc.subject	Coefficient of multiple determinations	en_US
dc.subject	Mean square fitting error	en_US
dc.subject	Relative prediction error	en_US
dc.subject	Reliability approximation	en_US
dc.subject	Software reliability growth model	en_US
dc.subject	Weibull distribution	en_US
dc.title	Exponentiated Weibull distribution approach based inflection S-shaped software reliability growth model	en_US
dc.type	Article	en_US