“GATE INTERFACE STUDY FOR THE IMPROVEMENT OF IONCONDUCTING DIELECTRIC BASED LOW OPERATING VOLTAGE THIN FILM TRANSISTOR

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dc.contributor.author Pal, Nila
dc.date.accessioned 2023-05-31T11:16:20Z
dc.date.available 2023-05-31T11:16:20Z
dc.date.issued 2022
dc.identifier.other TH1005
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/2399
dc.description This Thesis submited by PhD Scholar IIT(BHU), Varanasi & Supervised by Dr. Bhola Nath Pal. en_US
dc.description.abstract Thin-film transistors (TFT) serve as the foundation of flat-panel display devices. In order to achieve great performance while lowering production costs, researchers looked into a variety of materials in TFTs. Metal-oxides have gained a lot of attention in recent years for thin film transistors due to their broad area manufacturing compatibility, high mobility, and low leakage density properties. At present time, higher resolution, larger screen sizes, and reduced power consumption in FPDs have become increasingly important, which pushes traditional amorphous Si (a-Si) TFT technology to its limits. On the other hand, metal-oxide TFTs have been widely explored for a variety of applications, including phototransistor arrays, gas and pressure sensors, light emitting transistors, photo-detectors, memory, and synaptic devices etc. en_US
dc.language.iso en_US en_US
dc.publisher IIT(BHU), Varanasi en_US
dc.subject GATE INTERFACE en_US
dc.subject IONCONDUCTING en_US
dc.subject FILM TRANSISTOR en_US
dc.title “GATE INTERFACE STUDY FOR THE IMPROVEMENT OF IONCONDUCTING DIELECTRIC BASED LOW OPERATING VOLTAGE THIN FILM TRANSISTOR en_US
dc.type Thesis en_US


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