High-temperature relaxor ferroelectric behavior in Pr-doped SrTi O3

dc.contributor.author	Ranjan, R.
dc.contributor.author	Hackl, R.
dc.contributor.author	Chandra, A.
dc.contributor.author	Schmidbauer, E.
dc.contributor.author	Trots, D.
dc.contributor.author	Boysen, H.
dc.date.accessioned	2021-09-22T06:51:07Z
dc.date.available	2021-09-22T06:51:07Z
dc.date.issued	2007-12-20
dc.identifier.issn	1550235X
dc.identifier.uri	http://localhost:8080/xmlui/handle/123456789/1706
dc.description.abstract	Temperature-dependent Raman scattering, dielectric, and powder x-ray diffraction studies have been carried out on Pr-doped SrTi O3 ceramic samples. Activation of T O2 and T O4 polar modes indicated increasing degree of polar distortion by Pr doping. Dielectric measurements revealed that the system exhibits dielectric relaxation peaks at ∼500 K. The softening tendency of the polar T O1 soft mode decreases with increasing Pr doping. X-ray diffraction results show no evidence of symmetry breaking across the dielectric peak temperatures. The system exhibits features of high-temperature relaxor ferroelectrics.	en_US
dc.description.sponsorship	Physical Review B - Condensed Matter and Materials Physics	en_US
dc.language.iso	en	en_US
dc.relation.ispartofseries	Issue 22;Volume 76
dc.subject	Strontium Titanium Oxide;	en_US
dc.subject	Ferroelectric Materials;	en_US
dc.subject	Perovskites;	en_US
dc.title	High-temperature relaxor ferroelectric behavior in Pr-doped SrTi O3	en_US
dc.type	Article	en_US