Measurements of reflection coefficients of stratified layers using X-band bistatic scatterometers

Jha, K.K.; Singh, K.P.; Singh, R.N.

dc.contributor.author	Jha, K.K.
dc.contributor.author	Singh, K.P.
dc.contributor.author	Singh, R.N.
dc.date.accessioned	2021-08-27T11:26:41Z
dc.date.available	2021-08-27T11:26:41Z
dc.date.issued	1984-07
dc.identifier.issn	0973774X
dc.identifier.uri	http://localhost:8080/xmlui/handle/123456789/1587
dc.description.abstract	Laboratory modelling of earth's subsurface stratification has been carried out using X-band microwave bistatic scatterometer system. Look angle variation of reflectivity for various subsurface layers under dry and wet conditions have been measured. From measured reflectivity data and the reciprocity theorem the emissivity and the brightness temperature variations have been computed, and the data are in good agreement with reported results. The importance of laboratory and field measurements and its remote sensing application has been discussed. © 1984 Indian Academy of Sciences.	en_US
dc.description.sponsorship	Proceedings of the Indian Academy of Sciences - Earth and Planetary Sciences	en_US
dc.language.iso	en	en_US
dc.publisher	Springer India	en_US
dc.relation.ispartofseries	Issue 2,;Volume 93,
dc.subject	Bistatic scatterometer;	en_US
dc.subject	brightness temperature;	en_US
dc.subject	reflectivity;	en_US
dc.subject	remote sensing	en_US
dc.title	Measurements of reflection coefficients of stratified layers using X-band bistatic scatterometers	en_US
dc.type	Article	en_US